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| TUESDAY, June 8, 2004, 2:00 PM - 4:00 PM | Room: 6B | ||
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TOPIC AREA: BUSINESS | ||
| SESSION 7 | |||
| Panel: When IC Yield Missed the Target, Who is at Fault? | |||
| Chair: Lucio Lanza - Lanza techVentures, Palo Alto, CA | |||
| Organizers: Andrzej Strojwas | |||
| Silicon yield once was dominated by contaminants and particulates, making yield a process issue. But with today's electronics supply chain, multiple suspects may be indicted on manufacturability issues. Who is responsible for preventive actions in manufacturability and yield? The panelists, representing a foundry, a fabless company, an IP provider, two EDA vendors, and an IC design team, will discuss the problems and solutions for achieving manufacturability and yield goals. | |||
 7.1 |
When IC yield misses the target, who is at fault? |
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| Speaker(s): | Michael Campbell - QualComm, San Diego, CA Vassilios C. Gerousis - Infineon Tech, Munich, Germany John Kibarian - PDF Solutions, Inc, San Jose, CA Jim Hogan - Telos Venture Partners, Marc Levitt - Cadence Design Systems, Inc., San Jose, CA Walter Ng - Chartered Semiconductor, Milpitas, CA Dipu Pramanik - Synopsys, Mountain View, CA Mark Templeton - Artisan Components, Inc., Sunnyvale, CA | ||
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